Semiconductor Engineering· Aakash Jani·· 4 小时前
从功能监控到系统内测试：Movellus 与 Siemens 扩展电压感知可观测性
From Functional Monitoring To In-System Test: Extending Voltage-Aware Observability
事实摘要
Movellus 与 Siemens 在 Veloce proFPGA 平台上演示了将 Tessent In-System Test（IST）接入 Aeonic Insight 电压跌落检测器与 Tessent Embedded Analytics 功能监控的方案。
原文与核验
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正文 · 原文摘要
Separate false failures caused by voltage droop from real structural defects. The post From Functional Monitoring To In-System Test: Extending Voltage-Aware Observability appeared first on Semiconductor Engineering .
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来源：Semiconductor Engineering · semiengineering.com